In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

Support grids are a key part of electron microscopy measurements; the choice of the grid can directly influence the quality and accuracy of the final image. This is particularly true for transmission ...

Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...

For materials scientists, understanding the atomic structure of a material, revealing defects, or characterizing the chemical and physical processes that occur during the creation of material, are key ...